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Reverse Engineering, Semiconductor Laboratory [Sunnyvale, CA]
- Dedicated Chip level RE Lab Equipment
- Several high-power microscopes with Nomarsky and darkfield capabilities
- Optical Beam Induced Current
- Hot Spot Detection with LCD liquids
- Emission Microscopy
- SCANNING ELECTRON MICROSCOPY (SEM)
- Hitachi S-570 with EBIC and x-ray detectors
- Electron Beam Induced Current (EBIC)
- X-ray Energy Dispersive Spectroscopy (XED)
- Auger Electron Spectroscopy (AES)
- Voltage Contrast
- DECORATION TECHNIQUES
- STATE-OF-THE-ART CIRCUIT ELECTRICAL CHARACTERISTICS
- Complete lab with HP4145B, Micromanipulator 7000 probestation, Micromanipulator 3000 light tight enclosure
- Variety of mixed signal oscilloscopes, logic analyzers, programmable power supplies, Agilent pulse generators
- Electrostatic Discharge Sensitivity Test (ESD)
- Latchup characterization
- Dielectric Electrical Integrity Characterization
- RF CIRCUIT & PACKAGE CHARACTERIZATION
- Maury Loadpuller
- Agilent Infiinium Oscilloscope
- Agilent Wireless Standard emulator
- HARNESS TESTING OF CERAMICS
- Brinell Tester with micro-test capability
- Metallurgical Failure Analysis
- THIN FILM CHARACTERIZATION
- Nanometrics Nanospec
- Gaertner Ellipsometer
- X-RAY RADIOGRAPHY & DIFFRACTOMETRY
- Thermo Scientific Diffractometer
- PACKAGE DECAPSULATION
- Wet bench with hot plates
- SEQUENTIAL STRIPBACK
- DESTRUCTIVE PHYSICAL ANALYSIS & PROFILOMETRY
- CROSS SECTION FOR BOTH SEM & TEM (Parallel & Beveled)
- Diamond grinder down to 50nm
- MICRO ELECTRO MECHANICAL SYSTEMS (MEMS) TOOLS
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- MEMs tunable Fabry-Perot scanner
- MEMs tunable Fabry-Perot scanner
- TEMPERATURE CHARACTERIZATION
- Lindberg horizontal quartz tube furnace up to 1400C
- Several other furnaces for long-term burnin and characterization
- RESISTANCE & DOPING COUNTOUR PROFILOMETRY
- Signatone Spreading Resistance profilometer
- COMPLETE OPTICAL CHARACTERIZATION
- Vibration-free table with optical bench and wide assortment of optics
- Optical and near-IR monochromators
- Integrating sphere
- Variety of light sources
- COMPLETE SIMULATION CAPABILITIES
- Optical finite element simulation
- Mechanical simulation
- Thermal simulation
- State-of-the-art circuit simulation capability
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